A Method for Quantitatively Evaluating Thickness of Elastic Plates Using High-Overtone Bulk Acoustic Resonance
-
摘要: 基于声波高次谐振的频率偏移与弹性板厚度变化间的关系, 提出一种定量检测弹性板厚度的新方法。针对最大有效机电耦合系数(k2eff(max))对应的谐振模式, 研究了弹性板厚度对最大有效机电耦合系数对应模式的谐振频率的影响, 给出修正的频率偏移与厚度变化间的关系公式。相关数值计算表明, 该方法的检测灵敏度可达50 Hz/μm, 可用于板厚及其变化的检测和板表面状况的无损评价。Abstract: Based on the relations between the high-overtone bulk acoustic resonant frequency shifts and the changes of the elastic plate thickness, a method for the quantitative measurement of the thickness change of elastic plates was presented. For the harmonic mode with the maximum effective electromechanical coupling factor, the effects of the elastic plate thickness change on the order number of the mode were investigated, and the estimation formulae between frequency shift and thickness change were given. The numerical calculations demonstrated that the method had a high sensitivity of 50 Hz/μm, which could be used to nondestructively evaluate the thickness change and also the surface states of the elastic plates.
-
-
[1] Lakin K M, Kline G R, McCarron K T. High-Q microwave acoustic resonators and filters[J]. Microwave Theory and Techniques, IEEE Transactions, 1993, 41(12): 2139-2146. [2] Zhang Y X, Wang Z Q, Cheeke J D N. Resonant spectrum method to characterize piezoelectric films in composite resonators[J]. Ultrasonics, Ferroelectrics and Frequency Control, IEEE Transactions, 2003, 50(3): 321-333. [3] IEEE Standard on Piezoelectricity ANSI/IEEE Std 176-1987, 1988[S]. [4] Zhang H, Zhang S Y, Zheng K. Electrode effects on general modes in high-overtone bulk acoustic resonators[J]. Ultrasonics, 2006, 44(S1): e737-e740. [5] Zhang H, Zhang S Y, Fan L. Effects of thickness deviation of elastic plates in multi-layered resonance systems on frequency spectra[J]. Chinese Physics Letters, 2009, 26(8): 4301 [6] Pao Shih-Yung, Chao Min-Chiang, Wang Zuoqing, et al. Analysis and experiment of HBAR frequency spectra and applications to characterize the piezoelectric thin film and to HBAR design[C]. Frequency Control Symposium and PDA Exhibition, 2002. IEEE International: 2002: 27-35.
计量
- 文章访问数: 1
- HTML全文浏览量: 0
- PDF下载量: 0