TFT面阵探测器X射线数字透射成像

基金项目:

国防科技工业技术基础科研课题基金资助项目(T2007A001)

详细信息

TFT Flat Detector X-Ray Digital Transmission Imaging

摘要: 通过对裂纹模拟缺陷试件的数字透射成像检测试验，分析并研究了面阵探测器成像检测系统、透照参数、检测工艺与检测图像质量的关系，并给出了检测过程中应该注意的问题。具体试验表明：面阵探测器X射线数字成像系统在一定厚度范围内的检测效果(主要是图像的单丝像质计指数)优于同厚度的射线照相B级要求。
- 面阵列探测器 /
- 数字透射成像 /
- 检测参数 /
- 图像质量
Abstract: Through the simulation of crack defects of digital transmission imaging specimens, array detector imaging detection system, parameter, test process and the quality of images were analyzed and investigated, the points which should be paid attention to in the detection process were given. Experiments showed that the results primarily the rends of the image quality indication of single acquired by array detector X-ray digital imaging system within a certain thickness range were better than by the industrial radiography B level requirement within the same thickness.
- Flat detector /
- Digital transmission imaging /
- Parameter /
- Image quality

[1]	屠耀元，郑世才，李衍.射线检测技术[M].上海：世界图书出版公司,1997.
[2]	郑世才.射线实时成像检验技术[J].无损检测,2000,22(7):328-333.
[3]	美国无损检测学会，编.美国无损检测手册·射线卷[M].《美国无损检测手册》译审委员会，译.上海：世界图书出版公司,1992.
[4]	梁丽红，孔凡琴，路宏年.X射线非晶硅面阵探测器B级像质的研究[J].无损检测,2005,20(5):128-132.