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    线阵列探测器串扰试验

    Experimental Study on Characteristics in Linear Array Detectors

    • 摘要: 通过对芬兰DT公司生产的XSCAN0.4f线阵列探测器进行串扰试验,分析了X射线源的分布和光子在不同角度入射时对阵列探测器串扰的影响。介绍了探测器试验校准过程,包括偏置和增益的校准。讨论了准直狭缝试验和边沿试验中探测器的位置分辨力,发现在阵列探测器各单元工作性能稳定的情况下,串扰和散射是影响扫描图像均匀性的重要因素,而且相同能量的光子在垂直入射与斜入射情况下产生的串扰不同。

       

      Abstract: This paper mainly discussed the cross-talk in XSCAN0.4f type X-ray linear array detectors produced by DT company in Finland. The cross-talks between pixels that are caused by the distribution of X-rays and the different incident angles in array detectors are researched. The whole calibration procedures of array detectors including offset calibration and gain calibration are introduced. Slip experiments including both of vertical and oblique incidences and edge experiment are performed to discuss the position resolution of the detectors. It is found that cross-talk and scattering photons are the main factors to influence the response consistency of the detectors. The incident photons having the same energy shall however, cause different cross-talk at the situations of vertical and oblique incidence, respectively.

       

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