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超声相控阵技术的仿真试验

王海涛, 史振, 程继隆, 蒋俊, 梁斌

王海涛, 史振, 程继隆, 蒋俊, 梁斌. 超声相控阵技术的仿真试验[J]. 无损检测, 2011, 33(2): 31-34.
引用本文: 王海涛, 史振, 程继隆, 蒋俊, 梁斌. 超声相控阵技术的仿真试验[J]. 无损检测, 2011, 33(2): 31-34.
WANG Hai-Tao, SHI Zhen, CHENG Ji-Long, JIANG Jun, LIANG Bing. The Simulation Experiment of the Phased Array Ultrasonic Technology[J]. Nondestructive Testing, 2011, 33(2): 31-34.
Citation: WANG Hai-Tao, SHI Zhen, CHENG Ji-Long, JIANG Jun, LIANG Bing. The Simulation Experiment of the Phased Array Ultrasonic Technology[J]. Nondestructive Testing, 2011, 33(2): 31-34.

超声相控阵技术的仿真试验

基金项目: 

南京航空航天大学研究生创新基金资助项目

江苏省科技厅资助项目(BE2009162,BK2010503,BZ2009051)

国家质检总局科技计划资助项目(2009QK162)

详细信息
    作者简介:

    王海涛(1962-),男,副教授,博士,主要从事光电、超声相控阵技术和电磁无损检测的研究。

  • 中图分类号: TG115.28

The Simulation Experiment of the Phased Array Ultrasonic Technology

  • 摘要: 超声相控阵技术是一种先进的超声无损检测技术。超声相控阵技术通过对超声阵列换能器中各阵元进行精确延时控制,获得灵活可控的合成波束,并可随意控制聚焦点的位置。利用仿真相控阵合成聚焦技术的方法,搭建了一个16 阵元、超声信号发射、接收和处理试验系统。利用该系统对缺陷试块进行了检测试验,试验结果与实际试块缺陷情况吻合。通过对试块缺陷的检测试验,对比聚焦与不聚焦的检测效果,证明了相控阵合成聚焦技术可以极大地提高检测的信噪比和灵敏度,验证了相控阵聚焦可以提高检测能力。
    Abstract: Ultrasonic phased array testing technology is an advanced ultrasonic nondestructive testing technology. Ultrasonic phased array technology can achieve flexible, controllable synthesized ultrasound beam and freely control the focus point position by exciting each element of ultrasonic array transducer with independent phase delay. Based on the synthesis of phased array focusing approach experiment, a 16-element array signal acquisition and processing of experiment system was designed. Test experiments to the piece were carried out with this system. The experiment result fit with the actual defects. Result showed that this method could achieve the effect of phased array focusing, which greatly improved the detection signal noise ratio and sensitivity, also verified the ultrasonic phased array testing method was feasible. Through the experimental test of defect detection, especially with the contrast focusing and non-focusing detection experiment, the results showed that phased array technology could improve the defect detection capability.
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出版历程
  • 收稿日期:  2010-07-12
  • 刊出日期:  2011-02-09

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