新一代X射线探测器在射线实时成像检测中的应用

详细信息

Application of a New Generation of X-ray Sensitive Detectors in Real-time Radioscopic Inspection

摘要: 介绍非晶硅（a-Si）平板探测器的技术特性，及其取代常用的图像增强器在焊缝和铸件的工业射线实时成像(RTR)检测中的应用。试验结果证明，选用适当型号的a-Si平板探测器，可获得优于图像增强器的像质计（IQI）灵敏度和空间分辨率。
- 非晶硅（a-Si） /
- 平板探测器 /
- 图像增强器 /
- 射线实时成像 /
- 射线直接数字成像 /
- 像质计灵敏度 /
- 空间分辨率
Abstract: The technical properties of a new generation of X-ray sensitive detectors —— amorphous silicon （a-Si）flat-panel detectors were introduced. The new detectors could be in lieu of the usual image intensifier in X-ray real -time radioscopic (RTR) system for inspecting welds or castings. Experimental results showed that a suitable a-Si detector could achieve better IQI sensitivity and spatial resolution than an image intensifier. Its another new breakthrough bring the industrial direct digital radiography into the practical domain.
- Amorphous silicon(a-Si) /
- Flat-panel detector /
- Image intensifier /
- Real-time radioscopy /
- Direct digital imaging /
- IQI sensitivity /
- Spatial resolution

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