Abstract: The technical properties of a new generation of X-ray sensitive detectors —— amorphous silicon （a-Si）flat-panel detectors were introduced. The new detectors could be in lieu of the usual image intensifier in X-ray real -time radioscopic (RTR) system for inspecting welds or castings. Experimental results showed that a suitable a-Si detector could achieve better IQI sensitivity and spatial resolution than an image intensifier. Its another new breakthrough bring the industrial direct digital radiography into the practical domain.