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    高频超声相位反转缺陷识别

    Phase inversion defect identification using high-frequency ultrasound

    • 摘要: 高频超声在晶元制造和电子封装领域应用广泛,可有效检出材料内部空洞和分层等缺陷。内部空洞和分层等不连续缺陷的声阻抗常低于材料本身的,水浸检测时,与材料表面回波相比,其内部缺陷回波相位应出现反转。分析了相位反转的声学效应,研究了超声信号相位反转对应的时域和频域特征,提出基于时域信号包络的相位反转识别方法,比较了时域和频域相位反转计算方法的精度和效率差异。芯片高频超声成像结果表明,时域特征识别方法有较高的效率和准确性,利用闸门阈值还可以有效抑制噪声;频域识别方法的效率较低,且对噪声更敏感。

       

      Abstract: High-frequency ultrasound is widely used in wafer fabrication and electronic packaging, and can effectively detect defects such as holes and delamination in materials. The acoustic impedance of discontinuous defects such as internal cavities and delamination is often lower than that of the material itself, and the phase of the internal defect echo should be reversed compared with the surface echo of the material during water detection. The acoustic effects of phase reversal were analyzed. The time-domain and frequency-domain characteristics corresponding to ultrasonic signal phase reversal were studied. A phase inversion recognition method based on time-domain signal envelope was proposed. The accuracy and efficiency of phase reversal calculation methods in time-domain and frequency-domain were compared. The results of chip high-frequency ultrasonic imaging showed that the time-domain feature recognition method had higher efficiency and accuracy, and the gate threshold could effectively suppress noise, while the frequency domain recognition method had lower efficiency and was more sensitive to noise.

       

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