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    基于多元线性回归方法的缺陷轮廓量化分析

    Quantitative analysis of defect profile based on multiple linear regression method

    • 摘要: 为了实现缺陷二维边缘轮廓面积的量化,根据磁场在缺陷处的磁泄漏原理,得出缺陷处磁折射的扩散规则,分析了缺陷二维边缘轮廓的面积改变对漏磁信号的影响,提取轴向磁通密度分量和径向磁通密度分量中的5组特征值,使用最小二乘法和多元回归方法对漏磁信号的特征值和缺陷二维边缘轮廓面积进行拟合分析,并搭建漏磁检测试验平台进行验证。试验结果表明,缺陷二维边缘轮廓面积与缺陷处轴向和径向磁通密度分量特征值之间存在线性函数关系,使用多元线性回归方法进行缺陷量化得到的量化精度高,多元线性回归可作为一种可行的分析方法应用于漏磁检测的缺陷参数反演中。

       

      Abstract: In order to quantify the two-dimensional edge contour area of defects in magnetic flux leakage detection, the rule of magnetic refraction diffusion at the defect was obtained based on the magnetic leakage process. The influence of changes in the two-dimensional edge contour area of defects on magnetic flux leakage signals was studied and five groups of characteristic values for axial and radial magnetic flux components were extracted. Using the least square method and multiple regression method, the characteristic value of MFL signal was fitted and analyzed with respect to the two-dimensional edge contour area of defects, and an MFL detection experimental platform for verification was built. The results showed a corresponding relationship between the two-dimensional edge contour area of defects and eigenvalues of axial and radial flux components. The use of multiple linear regression method resulted in higher quantization accuracy for defect evaluation using magnetic flux leakage signals. Multiple linear regression could be a feasible analysis method for defect parameters inversion using leakage magnetic signals.

       

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