Abstract: In order to solve the problem of different signal-to-noise ratio caused by different detection process parameters of flat-panel detector in digital ray detection technology, the detection parameters were changed in turn, through the control variable method. Taking the XRD 0822 AP14 flat panel detector as the object, the images under different parameters were collected, and the signal-to-noise ratio of the collected images was statistically analyzed. The results show that the tube current, tube voltage, single frame exposure time and integration times had a great influence on the signal-to-noise ratio, while the gain had little effect on the signal-to-noise ratio. The experimental results can provide reference for the formulation of detection process to obtain better signal-to-noise ratio.