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一种X射线数字成像检测缺陷尺寸的测量方法

董方旭, 王从科, 凡丽梅, 赵付宝, 张霞, 郑素萍

董方旭, 王从科, 凡丽梅, 赵付宝, 张霞, 郑素萍. 一种X射线数字成像检测缺陷尺寸的测量方法[J]. 无损检测, 2020, 42(2): 21-24. DOI: 10.11973/wsjc202002005
引用本文: 董方旭, 王从科, 凡丽梅, 赵付宝, 张霞, 郑素萍. 一种X射线数字成像检测缺陷尺寸的测量方法[J]. 无损检测, 2020, 42(2): 21-24. DOI: 10.11973/wsjc202002005
DONG Fangxu, WANG Congke, FAN Limei, ZHAO Fubao, ZHANG Xia, ZHENG Suping. A method for measuring defect size by X-ray digital imaging detection[J]. Nondestructive Testing, 2020, 42(2): 21-24. DOI: 10.11973/wsjc202002005
Citation: DONG Fangxu, WANG Congke, FAN Limei, ZHAO Fubao, ZHANG Xia, ZHENG Suping. A method for measuring defect size by X-ray digital imaging detection[J]. Nondestructive Testing, 2020, 42(2): 21-24. DOI: 10.11973/wsjc202002005

一种X射线数字成像检测缺陷尺寸的测量方法

详细信息
    作者简介:

    董方旭(1990-),男,工程师,主要从事无损检测工作,727061825@qq.com

    通讯作者:

    王从科, E-mail:wck53@sina.com

  • 中图分类号: TG115.28

A method for measuring defect size by X-ray digital imaging detection

  • 摘要: 提出了一种X射线数字成像检测缺陷尺寸的测量方法。借鉴半波高法,以半波高法下的尺寸测量误差为基准,对不同缝隙尺寸试样在相同的检测条件下进行X射线数字成像检测,计算该检测条件下的总不清晰度,总结出缺陷尺寸与总不清晰度比值同波高比例的关系,并通过试验进行了验证。结果表明,该方法简单、实用性强,可为实现缺陷尺寸的准确测量提供技术支持。
    Abstract: A defect size measurement method based on X-ray digital imaging is proposed. Based on the half-wave height method and taking the dimension measurement error under the half-wave height method as the reference, X-ray digital imaging testing was carried out on the specimens with different slot sizes under the same testing conditions. The total ambiguity value under the same testing conditions was calculated, and the relationship between the ratio of defect size to total ambiguity and the ratio of wave height was summarized. The method was verified by the test. The results showed that the method was simple and practical and could provide technical support for accurate measurement of defect size.
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  • 被引次数: 0
出版历程
  • 收稿日期:  2019-06-24
  • 刊出日期:  2020-02-09

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