高级检索

    X射线照相技术的检测参数系统全景设计

    Panoramic Design of Detection Parameter System for X-ray Photography

    • 摘要: 根据X射线照相曝光曲线的技术特点,形成了X射线照相技术的检测参数系统全景设计。在全景设计图上可以进行设备的选用及性能比较,确定具体的透照参数,预设底片黑度结果,明确具体工艺的影像清晰度。提出了“球锥场”与“圆锥场”结合的分析方法,以全景设计图为基础可以开发检测参数分析软件,实现不同厚度工件的组合检测。

       

      Abstract: According to the technical characteristics of X-ray photography exposure curve, the panoramic design of detection parameter system for X-ray photography was formed. The equipment selection and performance comparison can be carried out on the panoramic design to determine the specific radiographic parameters and the default film blackness result, and furthermore to define the definition of specific process image. A combined analysis method of "spherical cone field" and "conical field" is proposed, the software of parameter analysis can be developed on the basis of panoramic design, and the realization of workpiece combination detection with different thickness can be achieved.

       

    /

    返回文章
    返回