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微区残余应力的毛细管X射线透镜检测方法

郭非, 安宁, 吴思宇, 周鹏, 刘芯, 李玉德

郭非, 安宁, 吴思宇, 周鹏, 刘芯, 李玉德. 微区残余应力的毛细管X射线透镜检测方法[J]. 无损检测, 2017, 39(7): 65-68. DOI: 10.11973/wsjc201707015
引用本文: 郭非, 安宁, 吴思宇, 周鹏, 刘芯, 李玉德. 微区残余应力的毛细管X射线透镜检测方法[J]. 无损检测, 2017, 39(7): 65-68. DOI: 10.11973/wsjc201707015
GUO Fei, AN Ning, WU Siyu, ZHOU Peng, LIU Xin, LI Yude. The Method of Capillary X-ray Lens Measurement of Micro-area Residual Stress[J]. Nondestructive Testing, 2017, 39(7): 65-68. DOI: 10.11973/wsjc201707015
Citation: GUO Fei, AN Ning, WU Siyu, ZHOU Peng, LIU Xin, LI Yude. The Method of Capillary X-ray Lens Measurement of Micro-area Residual Stress[J]. Nondestructive Testing, 2017, 39(7): 65-68. DOI: 10.11973/wsjc201707015

微区残余应力的毛细管X射线透镜检测方法

详细信息
    作者简介:

    郭非(1990-),男,硕士研究生,主要从事无损检测、应力分析、毛细管光学透镜研制等工作

    通讯作者:

    郭非, E-mail:guofei2004@sina.com

  • 中图分类号: TG115.28

The Method of Capillary X-ray Lens Measurement of Micro-area Residual Stress

  • 摘要: 针对现有小功率残余应力仪在进行微区应力检测时,存在衍射强度低导致测试准确度低、稳定性差等问题,阐述了一种毛细管X射线透镜结合应力仪实现微区应力检测的方法。采用基于全反射原理的透镜,通过对X射线的调控,形成微区照射面积,将相同照射面积下的光强度提高数十倍,且在衍射半高宽适度增大的情况下,对检测出的应力值影响不大。
    Abstract: The low-power residual stress measurement systems have disadvantage of poor accuracy and low stability due to weak detectable diffraction intensity. In this paper, a capillary X-ray optics has been applied in residual stress measurement systems for micro-area measurement. Through the regulation of X-ray and the formation of micro irradiation area, the area under the same irradiation intensity increase several times, and the FWHM of diffraction moderate increases, the stress value has little effect on accuracy.
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出版历程
  • 收稿日期:  2016-12-05
  • 刊出日期:  2017-07-09

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