The Contrast of Defect Tested by PAUT and RT
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摘要: 介绍了相控阵检测技术的几种成像方式, 并对焊缝模拟试板进行检测。将焊缝中的常见危害性缺陷如裂纹、层间未熔合的相控阵检测图像显示与常规射线检测底片显示进行了对比, 指出了各种缺陷在不同技术中显示的特点, 并分析了相控阵检测技术对缺陷性质的识别方法, 同时描述了该技术在无损检测中的优越性。Abstract: This passage introduces several imaging ways in phased array testing. We choose simulated defect test plate to detect. The images of familiar harmful defects in weld such as crack, layer incomplete fusion as obtained by phased array and radiograph were contrasted and analyzed. Image characteristics of several defects tested by different technology were indicated and the identification of defect properties in PAUT was preliminarily studied and the superiority of the technology was described.
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Keywords:
- Phased array /
- Radiograph /
- Crack /
- Sector scan
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