Measurement of Strain Based on Electronic Shearing Speckle Pattern Interferometry
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Graphical Abstract
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Abstract
A review of strain measurement based on electronic shearing speckle pattern interferometry(ESSPI) was presented. Some concepts on speckle pattern were addressed on the basis of speckle statistic optics, which was superior to traditional optics in understanding speckle interfering behavior. Finally, strain measurement formula was derived.
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