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    CHEN Xin-bo, SUN Jin-li, YUAN Ying-min, ZHANG Hai-bing. Design of Electromagnetic Compatibility for Comprehensive Nondestructive Testing System[J]. Nondestructive Testing, 2007, 29(10): 571-572.
    Citation: CHEN Xin-bo, SUN Jin-li, YUAN Ying-min, ZHANG Hai-bing. Design of Electromagnetic Compatibility for Comprehensive Nondestructive Testing System[J]. Nondestructive Testing, 2007, 29(10): 571-572.
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    Design of Electromagnetic Compatibility for Comprehensive Nondestructive Testing System

      Abstract
    • The basic factors that generate the electromagnetic interference(EMI) in comprehensive nondestructive testing system were analyzed. The design methods for reducing EMI with hardware and software were presented. It was suecessful on solving the electromagnetic compatibility(EMC) problem.
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