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    ZHANG Si-Quan, CHEN Tie-Qun, ZHU Jia-Zhen. The Development of Pulsed Eddy Current Testing Technique[J]. Nondestructive Testing, 2008, 30(11): 838-841.
    Citation: ZHANG Si-Quan, CHEN Tie-Qun, ZHU Jia-Zhen. The Development of Pulsed Eddy Current Testing Technique[J]. Nondestructive Testing, 2008, 30(11): 838-841.

    The Development of Pulsed Eddy Current Testing Technique

    • Pulsed Eddy Current Testing (PECT) is a new eddy current testing technology used in metallic subsurface defect testing. As the transient eddy current response signals due to the interaction of transient eddy current with a defect in a conductive plate contain sufficient information of defect, can potentially make PECT quantify defect fast,also increases the difficulty of interpretation the response signals. The recently progress both inland and overseas in studying of the transient eddy current response and the method to suppress lift-off noise were discussed. The future trend of development of PECT was analyzed.
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