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    JIANG Yun-Xi, ZHU Zheng, HE Xiao-Yu, Torsten Loeffler, Theo Hoyer, Holger Quast. The Application of Fast All-Electronic Terahertz/Millimeter Wave Imaging Technology in Nondestructive Testing[J]. Nondestructive Testing, 2011, 33(12): 51-53.
    Citation: JIANG Yun-Xi, ZHU Zheng, HE Xiao-Yu, Torsten Loeffler, Theo Hoyer, Holger Quast. The Application of Fast All-Electronic Terahertz/Millimeter Wave Imaging Technology in Nondestructive Testing[J]. Nondestructive Testing, 2011, 33(12): 51-53.
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    The Application of Fast All-Electronic Terahertz/Millimeter Wave Imaging Technology in Nondestructive Testing

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    • It introduced the principle of fast all-electronic 3D THz FMCW imaging technology, and its application in nondestructive inspection. This technology could get a wonderful result for different composite material inspection.
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