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    LIU Long, MENG Guang. The Application Status of Electronic Speckle Pattern Interferometric Nondestructive Testing[J]. Nondestructive Testing, 2006, 28(1): 28-30.
    Citation: LIU Long, MENG Guang. The Application Status of Electronic Speckle Pattern Interferometric Nondestructive Testing[J]. Nondestructive Testing, 2006, 28(1): 28-30.

    The Application Status of Electronic Speckle Pattern Interferometric Nondestructive Testing

    • Based on modern high technologies such as laser, video, electronics, image processing and holography, ESPI(Electronic Speckle Pattern Interferometry) is a non-contact measuring method, which can measure the small static and dynamitic surface deformations and reveal flaws by looking for flaw-induced deformation anomalies. With the advantages of high precision, high sensitivity, wide frequency bandwidth and full-field real-time testing, it has a promising future in engineering. Its basic theory and recent applications in nondestructive testing are reviewed. Finally, its scope for improvement is discussed.
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