LI Wei, SU Zhi-zhun, LIU Rui-zhe, JIA Qing-long, WANG He. Discussion on X-ray Scan System Converted to Industrial CT System[J]. Nondestructive Testing, 2007, 29(10): 588-590.
Citation:
LI Wei, SU Zhi-zhun, LIU Rui-zhe, JIA Qing-long, WANG He. Discussion on X-ray Scan System Converted to Industrial CT System[J]. Nondestructive Testing, 2007, 29(10): 588-590.
LI Wei, SU Zhi-zhun, LIU Rui-zhe, JIA Qing-long, WANG He. Discussion on X-ray Scan System Converted to Industrial CT System[J]. Nondestructive Testing, 2007, 29(10): 588-590.
Citation:
LI Wei, SU Zhi-zhun, LIU Rui-zhe, JIA Qing-long, WANG He. Discussion on X-ray Scan System Converted to Industrial CT System[J]. Nondestructive Testing, 2007, 29(10): 588-590.
Discussion on X-ray Scan System Converted to Industrial CT System
Industrial CT is advanced instrument that examining complicated solid blemish precise orientation. Because of the X-ray scan system is of low spatial resolution, the possibility of converting X-ray scan system to horizontal industrial CT was discussed, and it also brought a way of solution to the conversion.
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