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    WANG Dan, XU Bin-shi, DONG Shi-yun, DONG Li-hong. Discussion on Background Magnetic Field Control in Metal Magnetic Memory Testing[J]. Nondestructive Testing, 2007, 29(2): 71-73.
    Citation: WANG Dan, XU Bin-shi, DONG Shi-yun, DONG Li-hong. Discussion on Background Magnetic Field Control in Metal Magnetic Memory Testing[J]. Nondestructive Testing, 2007, 29(2): 71-73.

    Discussion on Background Magnetic Field Control in Metal Magnetic Memory Testing

    • Investigations were made on the channel-compensated method of background magnetic field control, which was widely used in metal magnetic memory testing. Experimental results showed that the method did not eliminate the influence of background magnetic field. Moreover, the related influence factors were pointed out based on the above analysis, and a finite element analysis method for background magnetic field control in metal magnetic memory testing was put forward.
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