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    PENG Guang-han, CAI Xin-hua, QIAO Nao-sheng, LIU Chang-qing, YANG Xue-heng. Scattering Correction for X-ray TICT in Testing Composites Workpiece[J]. Nondestructive Testing, 2007, 29(4): 181-184.
    Citation: PENG Guang-han, CAI Xin-hua, QIAO Nao-sheng, LIU Chang-qing, YANG Xue-heng. Scattering Correction for X-ray TICT in Testing Composites Workpiece[J]. Nondestructive Testing, 2007, 29(4): 181-184.

    Scattering Correction for X-ray TICT in Testing Composites Workpiece

    • In the case of a polychromatic source in X-ray TICT, the phenomenon of Compton photon scattering in material takes place.Scattering photon with useful message getting into detectors leads to false image. The precise accurate models equation of scattering correction about interal composites workpiece in X-ray TICT from Compton scattering intensity equation is deduced for wiping out the false image efficiently,which results from photon scattering. By subtracting the count of scattering photon from the one of each detector,it can wipe off the false image for scattering photon effectively for X-ray TICT in testing composites workpiece.
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