Simulation of X-Ray Diffraction Profiles By Computer

A method to simulate X-ray diffraction profiles by using Voigt function and Poisson distribution was established. The statistical evaluation showed that the measured and the corresponding simulated X-ray profiles could be viewed as coming from the same parent population. Results demonstrated that the simulated profiles could be used to replace the measured ones and to solve such problems as evaluation of absolute errors in analyzing X-ray diffraction profiles.