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    XIAO Suhua, WANG Zhiyong, ZHANG Shunjun, LUO Wenbin, CAO Yingbin. Laser marking intelligent defect detection system based on machine vision[J]. Nondestructive Testing, 2021, 43(7): 79-82. DOI: 10.11973/wsjc202107019
    Citation: XIAO Suhua, WANG Zhiyong, ZHANG Shunjun, LUO Wenbin, CAO Yingbin. Laser marking intelligent defect detection system based on machine vision[J]. Nondestructive Testing, 2021, 43(7): 79-82. DOI: 10.11973/wsjc202107019

    Laser marking intelligent defect detection system based on machine vision

    • At present, when using machine vision methods to detect product defects, different products must be reprogrammed and developed, and even similar products with different specifications are facing the same problem. A reconfigurable and open intelligent defect detection system was developed. Based on the OpenCV/C++ joint programming, the defect detection algorithm is optimized, and the custom function of the pixel value of the defect area is developed to meet the needs of users with different precisions and speeds for personalized customization. Taking the defect detection of mobile phone adapter laser marking as an example, the defect detection system is designed. The test results show that the system has stable function, reliable performance and good practicability.
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