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    YAN Jiangang, GAO Ming, LUO Jun. The Application of Eddy Current Technology in Automatic Detection of Tungsten Pin[J]. Nondestructive Testing, 2018, 40(6): 6-8. DOI: 10.11973/wsjc201806002
    Citation: YAN Jiangang, GAO Ming, LUO Jun. The Application of Eddy Current Technology in Automatic Detection of Tungsten Pin[J]. Nondestructive Testing, 2018, 40(6): 6-8. DOI: 10.11973/wsjc201806002

    The Application of Eddy Current Technology in Automatic Detection of Tungsten Pin

    • The specification of short tungsten pin (W pin) for lighting application is introduced. The pin was loaded by vibration unit and inspected by eddy current. After inspection, the pin was sealed into the lamp to check the leakage in order to verify the reliability of the test. Unlike the traditional machine which can only issue warning alarm, current machine is able to pick out the rejected pins, thus guaranteeing high lumen output and long life of light products.
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