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    ZHONG Fei, ZHANG Xiaochun, HUANG Shengping, ZHANG Mengcen, WANG Chong, NIE Ming, LI Shunhua, LIU Guote. The X-DR Imaging Detection of Simulation Defect in GIS Basin-Type Insulator[J]. Nondestructive Testing, 2018, 40(1): 45-49. DOI: 10.11973/wsjc201801011
    Citation: ZHONG Fei, ZHANG Xiaochun, HUANG Shengping, ZHANG Mengcen, WANG Chong, NIE Ming, LI Shunhua, LIU Guote. The X-DR Imaging Detection of Simulation Defect in GIS Basin-Type Insulator[J]. Nondestructive Testing, 2018, 40(1): 45-49. DOI: 10.11973/wsjc201801011

    The X-DR Imaging Detection of Simulation Defect in GIS Basin-Type Insulator

    • In this paper, X-DR imaging technology is applied to the visualization nondestructive testing of basin-type insulator. Without dismantling and destroying the GIS device, it can realize the radiography and defect detection of basin-type insulator. The optimal parameters of the X-ray machine are found by orthogonal test method, which can greatly reduce the number of experiments and improve the efficiency of the experiment. The results show that the X-DR imaging technology can be used to identify the cracks and bubble defects of the basin-type insulator.
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