The Method of Capillary X-ray Lens Measurement of Micro-area Residual Stress

The low-power residual stress measurement systems have disadvantage of poor accuracy and low stability due to weak detectable diffraction intensity. In this paper, a capillary X-ray optics has been applied in residual stress measurement systems for micro-area measurement. Through the regulation of X-ray and the formation of micro irradiation area, the area under the same irradiation intensity increase several times, and the FWHM of diffraction moderate increases, the stress value has little effect on accuracy.